Archived News

Sigmadyne to Exhibit at SPIE Photonics West 2015
Sigmadyne to exhibit at SPIE Photonics West Feb 10-12, 2015 in San Francisco, CA, USA. Come visit us at booth #618 on the New York Cluster!

Archived News

Integrated Optomechanical Analysis to be Taught at 2014 UR Optics Summer School
Sigmadyne will co-teach Integrated Optomechanical Analysis in Rochester, NY on June 4-6, 2014 at the University of Rochester Institute of Optics Summer School. Interested students may download course syllabus information and can register here.

Sigmadyne to Exhibit at SPIE Astronomical Telescopes and Instrumentation 2014
Sigmadyne to exhibit at SPIE Astronomical Telescopes and Instrumentation June 25 and 26, 2014 Montréal, Quebec, Canada. Come visit us at booth #408!

SigFit 2013R1 Released
SigFit version 2013R1 was released on October 28, 2013. Main feature improvements and additions are as follows:

Import of Optical Model Into VSigFit
VSigFit now allows the import of surface geometry definitions from either Code V .seq or Zemax .zmx files.

Toroid Surface Geometry Supported
Toroid surface geometries are supported for both CodeV and Zemax. While surface deformations may be included into Zemax through sag standard Zernike polynomials, surface deformation in CodeV are included through normal surface deformation INT file descriptions.

Monte Carlo Analysis Optics File Output
The user may now request optical results files to be generated for every Monte Carlo realization so that subsequent Monte Carlo analysis may be performed in the optical analysis software. The optical files are written to a separate folder to keep the potentially enormous number of files manageable within one place.

New Features in Input and Output Interpolation
The PNG plot feature introduced in v2012R1 has now been extended to visualization of input and output interpolation.

New Features in Stress-Optic Analysis
When SigFit is interfaced to finite element codes that report stress results at midside nodes higher order shape functions using those midside nodes are now used for interpolation during the integration process. In cases where only the corner stress data is available then the linear shape functions are used. When using disturbance data from Nastran nonlinear analysis stress-optic analysis may access user selectable load steps. In addition, elements may now belong to multiple lenses, which is important for multiple pass systems.

Aero-Optic Analysis Added
A new analysis type, aero-optic analysis, licensed within the OPD analysis option (thermo-optic, stress-optic, stress-induced birefringence) has been added. Aero-optic analysis allows user to generate OPD predictions due to density variations in fluid flows as predicted by CFD analysis.

Nastran Displacements From OP4 Files
A DMAP alter is now provided with SigFit to export surface displacements from Nastran to an OP4 file. SigFit can now read this OP4 file generated by the supplied DMAP. The advantage of this OP4 format is that the results data contains all 16 digits of precision rather than only 7 as in the punch or
OP2 files.

Nastran Displacements From OP2 Files
Surface displacements may now be read from OP2 files written by Nastran.

Percent Not Fit Added to F-Format Tables
The percent not fit has been added as a result output to the polynomial fitting table output in the .fit file. The percent not fit is computed using the surface RMS error before and after the fit.

Tolerance Added to Surface Aperture and Obstruction Specifications
A tolerance has been added to the definition of surface apertures and obstructions to allow easier selection of nodes at the edges of apertures and obstructions.

Zemax Binary 1 Surface Supported for OPD Analyses
XY polynomials of OPD may now be written to the optical analysis output files for Zemax. Such data is formatted into Binary 1 surface types in the .zpl file(s) written by SigFit.

Monte Carlo Variation Specification
Monte Carlo variations may now be specified as either differential or absolute descriptions. This distinction is only important if the user has specified a nominal disturbance to be used in the analysis. While differential descriptions are relative to the nominal state, absolute description include the nominal state. See the MONTE and MCVAR entries in the dictionary for more details.

Interpolation of CAO Improved
Interpolation of crystal axis orientation (CAO) computed in a stress-induced birefringence analysis is improved to accomodate the discontinuous nature of CAO.